Few layers graphene on 6H-SiC(000-1): an STM study

Details Few layers graphene on 6H-SiC(000-1): an STM study Few layers graphene on 6H-SiC(000-1): an STM study

2008-01-08

arxiv.org/abs/0801.1188v1

Physical Review B 77 (2008) 165415

Physics

Condensed Matter

Materials Science

20 pages

Scientific paper

10.1103/PhysRevB.77.165415

We have analyzed by Scanning Tunnelling Microscopy (STM) thin films made of few (3-5) graphene layers grown on the C terminated face of 6H-SiC in order to identify the nature of the azimuthal disorder reported in this material. We observe superstructures which are interpreted as Moir\'e patterns due to a misorientation angle between consecutive layers. The presence of stacking faults is expected to lead to electronic properties reminiscent of single layer graphene even for multilayer samples. Our results indicate that this apparent electronic decoupling of the layers can show up in STM data.

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