Physics – Condensed Matter
Scientific paper
1995-06-01
Physics
Condensed Matter
uuencoded compressed postscript-file (4 pages)
Scientific paper
10.1103/PhysRevB.52.7857
We have studied the resistivity, $\rho$, of a two-dimensional electron system in silicon in the temperature range 200 mK < T < 7.5 K at zero magnetic field at low electron densities, when the electron system is in the insulating regime. Our results show that at an intermediate temperature range $\rho=\rho_0 exp[(T_0/T)^{1/2}]$ for at least four orders of magnitude up to 3x10^9 Ohms. This behavior is consistent with the existence of a Coulomb gap. Near the metal/insulator transition, the prefactor was found to be close to $h/e^2$, and resistivity scales with temperature. For very low electron densities, $n_s$, the prefactor diminishes with diminishing $n_s$. A comparison with the theory shows that a specific set of conditions are necessary to observe the behavior of resistivity consistent with the existence of the Coulomb gap.
Bowker G. E.
Furneaux J. E.
Kravchenko S. V.
Mason Whitney
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