Evaluation of Russian-grown Cd0.8Zn0.2Te

Details Evaluation of Russian-grown Cd0.8Zn0.2Te Evaluation of Russian-grown Cd0.8Zn0.2Te

Jul 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997spie.3115..305s&link_type=abstract

Proc. SPIE Vol. 3115, p. 305-310, Hard X-Ray and Gamma-Ray Detector Physics, Optics, and Applications, Richard B. Hoover; F. Pat

Physics

Optics

Scientific paper

More recent Russian grown single crystals of Cd(subscript 0.8)Zn(subscript 0.2)Te (CZT) were evaluated using proton induced x ray emission (PIXE), x ray diffraction (XRD), photoluminescence (PL), infra red (IR) transmission microscopy, leakage current measurements and response to nuclear radiation. Whereas in the past the Russian grown samples were not acceptable for gamma ray detectors application, the present samples had a somewhat better crystallinity and a higher resistivity, and did even show distinct photopeaks for an (superscript 241)Am spectrum. Differences in the material properties between various Russian (n- and p-type) and U.S. (n-type) CZT are described.

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