Enhanced critical current density of YBa2Cu3Ox films grown on Nd1/3Eu1/3Gd1/3Ba2Cu3Ox with nano-undulated surface morphology

Physics – Condensed Matter – Superconductivity

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

4 pages, 4 figures

Scientific paper

We report a simple and easily controllable method where a nano-undulated surface morphology of Nd1/3Eu1/3Gd1/3Ba2Cu3Ox (NEG) films leads to a substantial increase in the critical current density in superconducting YBa2Cu3Ox (YBCO) films deposited by pulsed laser deposition on such NEG layers. The enhancement is observed over a wide range of fields and temperatures. Transmission electron microscopy shows that such YBCO films possess a high density of localized areas, typically 20 x 20 nm2 in size, where distortion of atomic planes give rotational (2 to 5 degrees) moire patterns. Their distribution is random and uniform, and expected to be the origin of the enhanced flux pinning. Magneto-optical imaging shows that these films have excellent macroscopic magnetic uniformity.

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

Enhanced critical current density of YBa2Cu3Ox films grown on Nd1/3Eu1/3Gd1/3Ba2Cu3Ox with nano-undulated surface morphology does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Enhanced critical current density of YBa2Cu3Ox films grown on Nd1/3Eu1/3Gd1/3Ba2Cu3Ox with nano-undulated surface morphology, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Enhanced critical current density of YBa2Cu3Ox films grown on Nd1/3Eu1/3Gd1/3Ba2Cu3Ox with nano-undulated surface morphology will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-434574

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.