Energy levels of few electron quantum dots imaged and characterized by atomic force microscopy

Details Energy levels of few electron quantum dots imaged and characterized by atomic force microscopy Energy levels of few electron quantum dots imaged and characterized by atomic force microscopy

2009-09-30

arxiv.org/abs/0910.0005v1

PNAS, 107 9496-9501 (2010)

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

11 pages, 6 figures

Scientific paper

10.1073/pnas.0912716107

Strong confinement of charges in few electron systems such as in atoms, molecules and quantum dots leads to a spectrum of discrete energy levels that are often shared by several degenerate quantum states. Since the electronic structure is key to understanding their chemical properties, methods that probe these energy levels in situ are important. We show how electrostatic force detection using atomic force microscopy reveals the electronic structure of individual and coupled self-assembled quantum dots. An electron addition spectrum in the Coulomb blockade regime, resulting from a change in cantilever resonance frequency and dissipation during tunneling events, shows one by one electron charging of a dot. The spectra show clear level degeneracies in isolated quantum dots, supported by the first observation of predicted temperature-dependent shifts of Coulomb blockade peaks. Further, by scanning the surface we observe that several quantum dots may reside on what topologically appears to be just one. These images of grouped weakly and strongly coupled dots allow us to estimate their relative coupling strengths.

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