Elemental depth profiling of fluoridated hydroxyapatite by X-ray photoelectron spectroscopy

Physics – Condensed Matter – Materials Science

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

9 pages, 5 figures, 1 table

Scientific paper

Structural and chemical changes that arise from a fluoridation of synthetic hydroxyapatite in neutral and acidic fluoridation agents are investigated. For synthetic hydroxyapatite (Ca5(PO4)3OH = HAp), the elemental depth profiles were determined by X-ray photoelectron spectroscopy (XPS) to reveal the effect of fluoridation in nearly neutral (pH = 6.2) and acidic agents (pH = 4.2). Due to the high surface sensitivity of the technique, the depth profiles have a resolution on the nm scale. With respect to the chemical composition and the crystal structure XPS depth profiling revealed very different effects of the two treatments. In both cases, however, the fluoridation affects the surface only on the nm scale which is in contrast to recent literature, where a penetration depth up to several microns was reported. Moreover, evidence is given that the actual fluoridation depth depends on the pH value. Recently, a qualitative three layer model was proposed for the fluoridation of HAp in an acidic agent. In addition to the elemental depth profile, as presented also by various other authors, we present a quantitative depth profile of the compounds CaF2, Ca(OH)2 and fluorapatite (FAp) that are predicted by the three layer model. The analysis of our experimental data exactly reproduces the structural order of the model, however, on a scale that differs by nearly two orders of magnitude from previous predictions. Our results also reveal that the amount of Ca(OH)2 and FAp is small as compared to that of CaF2. Therefore, it has to be questioned whether such narrow Ca(OH)2 and FAp layers really can act as protective layers for the enamel.

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

Elemental depth profiling of fluoridated hydroxyapatite by X-ray photoelectron spectroscopy does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Elemental depth profiling of fluoridated hydroxyapatite by X-ray photoelectron spectroscopy, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Elemental depth profiling of fluoridated hydroxyapatite by X-ray photoelectron spectroscopy will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-400675

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.