Electron scattering in atomic force microscopy experiments

Details Electron scattering in atomic force microscopy experiments Electron scattering in atomic force microscopy experiments

2005-10-13

arxiv.org/abs/cond-mat/0510348v1

Physics

Condensed Matter

Materials Science

5 pages and 4 figures

Scientific paper

10.1016/j.cplett.2005.12.065

It has been shown that electron transitions, as measured in a scanning tunnelling microscope (STM), are related to chemical interactions in a tunnelling barrier. Here, we show that the shape and apparent height of subatomic features in an atomic force microscopy (AFM) experiment on Si(111) depend directly on the available electron states of the silicon surface and the silicon AFM tip. Simulations and experiments confirm that forces and currents show similar subatomic variations for tip-sample distances approaching the bulk bonding length.

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