Electron diffraction analysis of individual single-walled carbon nanotubes

Details Electron diffraction analysis of individual single-walled carbon nanotubes Electron diffraction analysis of individual single-walled carbon nanotubes

2005-06-15

arxiv.org/abs/cond-mat/0506356v2

Ultramicroscopy vol. 106 no. 3, pp. 176-190 (2006)

Physics

Condensed Matter

Materials Science

10 pages, 10 figures. Ultramicroscopy (in press), 2005

Scientific paper

10.1016/j.ultramic.2005.07.008

We present a detailed electron diffraction study of individual single-walled carbon nanotubes. A novel sample preparation procedure provides well-separated, long and straight individual single-shell nanotubes. Diffraction experiments are carried out at 60kV, below the threshold for knock-on damage in carbon nanotubes. We describe experimental parameters that allow single-tube electron diffraction experiments with widely available thermal emission transmission electron microscopes. Further, we review the simulation of diffraction patterns for these objects.

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