Electrically detected magnetic resonance using radio-frequency reflectometry

Details Electrically detected magnetic resonance using radio-frequency reflectometry Electrically detected magnetic resonance using radio-frequency reflectometry

2009-07-12

arxiv.org/abs/0907.2022v1

Rev. Sci. Instrum. 80, 114705 (2009)

Physics

Condensed Matter

Materials Science

9 pages, 3 figures

Scientific paper

10.1063/1.3258206

The authors demonstrate readout of electrically detected magnetic resonance at radio frequencies by means of an LCR tank circuit. Applied to a silicon field-effect transistor at milli-kelvin temperatures, this method shows a 25-fold increased signal-to-noise ratio of the conduction band electron spin resonance and a higher operational bandwidth of > 300 kHz compared to the kHz bandwidth of conventional readout techniques. This increase in temporal resolution provides a method for future direct observations of spin dynamics in the electrical device characteristics.

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