Electrical Nanoprobing of Semiconducting Carbon Nanotubes using an Atomic Force Microscope

Details Electrical Nanoprobing of Semiconducting Carbon Nanotubes using an Atomic Force Microscope Electrical Nanoprobing of Semiconducting Carbon Nanotubes using an Atomic Force Microscope

2003-05-06

arxiv.org/abs/cond-mat/0305108v3

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

4 pages, 5 figures

Scientific paper

10.1103/PhysRevLett.92.046401

We use an Atomic Force Microscope (AFM) tip to locally probe the electronic properties of semiconducting carbon nanotube transistors. A gold-coated AFM tip serves as a voltage or current probe in three-probe measurement setup. Using the tip as a movable current probe, we investigate the scaling of the device properties with channel length. Using the tip as a voltage probe, we study the properties of the contacts. We find that Au makes an excellent contact in the p-region, with no Schottky barrier. In the n-region large contact resistances were found which dominate the transport properties.

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