Electric scanning probe imaging and modification of ferroelectric surfaces

Details Electric scanning probe imaging and modification of ferroelectric surfaces Electric scanning probe imaging and modification of ferroelectric surfaces

2003-01-28

arxiv.org/abs/cond-mat/0301535v1

Physics

Condensed Matter

Materials Science

43 pages, 21 figures, to be published in "Nanoscale characterization of ferroelectric materials", Ed. A. Gruverman and M. Alex

Scientific paper

Electric Scanning Probe Microscopies are used to characterize the surface behavior of ferroelectric materials. The effects of local charge density on the chemistry and physics of ferroelectric surfaces are investigated. The kinetics and thermodynamics parameters of adsorption are assessed by variable temperature Scanning Surface Potential Microscopy. Contrast formation mechanism of Piezoresponse Force Microscopy (PFM) is analyzed in detail, and the contributions of electroelastic constants of the material to response amplitude are determined. The effect of experimental conditions including indentation force and tip radius of curvature is elucidated using PFM Contrast Mechanism Maps. Simple quantitative criterion for non-local cantilever-surface interactions in PFM is developed.

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