Electric field effects in STM imaging

Details Electric field effects in STM imaging Electric field effects in STM imaging

1997-10-08

arxiv.org/abs/cond-mat/9710076v1

Appl. Phys. A 66, 907(1998)

Physics

Condensed Matter

Materials Science

4 pages, RevTeX, epsf files

Scientific paper

We present a high voltage extension of the Tersoff-Hamann theory of STM images, which includes the effect of the electric field between the tip and the sample. The theoretical model is based on first principles electronic structure calculations and has no adjustable parameters. We use the method to calculate theoretical STM images of the monohydrate Si(100)-H(2$\times$1) surface with missing hydrogen defects at $- 2$~V and find an enhanced corrugation due to the electric field, in good agreement with experimental images.

Affiliated with

Also associated with

No associations

Rating

Electric field effects in STM imaging does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Electric field effects in STM imaging, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electric field effects in STM imaging will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-129802