Electric field and tip geometry effects on dielectrophoretic growth of carbon nanotube nanofibrils on scanning probes

Details Electric field and tip geometry effects on dielectrophoretic growth of carbon nanotube nanofibrils on scanning probes Electric field and tip geometry effects on dielectrophoretic growth of carbon nanotube nanofibrils on scanning probes

2011-06-19

arxiv.org/abs/1106.3715v1

Nanotechnology 2008, 19, 455303

Physics

Condensed Matter

Materials Science

Scientific paper

10.1088/0957-4484/19/45/455303

Single-wall carbon nanotube (SWNT) nanofibrils were assembled onto a variety of conductive scanning probes including atomic force microscope (AFM) tips and scanning tunnelling microscope (STM) needles using positive dielectrophoresis (DEP). The magnitude of the applied electric field was varied in the range of 1-20 V to investigate its effect on the dimensions of the assembled SWNT nanofibrils. Both length and diameter grew asymptotically as voltage increased from 5 to 18 V. Below 4 V, stable attachment of SWNT nanofibrils could not be achieved due to the relatively weak DEP force versus Brownian motion. At voltages of 20 V and higher, low quality nanofibrils resulted from incorporating large amounts of impurities. For intermediate voltages, optimal nanofibrils were achieved, though pivotal to this assembly is the wetting behaviour upon tip immersion in the SWNT suspension drop. This process was monitored in situ to correlate wetting angle and probe geometry (cone angles and tip height), revealing that probes with narrow cone angles and long shanks are optimal. It is proposed that this results from less wetting of the probe apex, and therefore reduces capillary forces and especially force transients during the nanofibril drawing process. Relatively rigid probes (force constant >= 2 N/m) exhibited no perceivable cantilever bending upon wetting and de-wetting, resulting in the most stable process control.

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