Efficient Quasiparticle Evacuation in Superconducting Devices

Details Efficient Quasiparticle Evacuation in Superconducting Devices Efficient Quasiparticle Evacuation in Superconducting Devices

2011-06-24

arxiv.org/abs/1106.4949v1

Phys. Rev. B 85, 020505(R) (2012)

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

4 pages, 4 figures

Scientific paper

We have studied the diffusion of excess quasiparticles in a current-biased superconductor strip in proximity to a metallic trap junction. In particular, we have measured accurately the superconductor temperature at a near-gap injection voltage. By analyzing our data quantitatively, we provide a full description of the spatial distribution of excess quasiparticles in the superconductor. We show that a metallic trap junction contributes significantly to the evacuation of excess quasiparticles.

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