Physics – Condensed Matter – Mesoscale and Nanoscale Physics
Scientific paper
2003-06-24
Physics
Condensed Matter
Mesoscale and Nanoscale Physics
27 pages, 6 eps figures; RevTex
Scientific paper
10.1103/PhysRevB.69.075308
The reflection spectrum of a multiple quantum well structure with an inserted defect well is considered. The defect is characterized by the exciton frequency different from that of the host's wells. It is shown that for relatively short structures, the defect produces significant modifications of the reflection spectrum, which can be useful for optoelectronic applications. Inhomogeneous broadening is shown to affect the spectrum in a non-trivial way, which cannot be described by the standard linear dispersion theory. A method of measuring parameters of both homogeneous and inhomogeneous broadenings of the defect well from a single CW reflection spectrum is suggested.
Deych Lev I.
Erementchouk Mikhael V.
Lisyansky Alexander A.
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