Effects of cosmic rays on single event upsets

Details Effects of cosmic rays on single event upsets Effects of cosmic rays on single event upsets

Feb 1989

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1989hiva.rept.....v&link_type=abstract

Status Report Hampton Inst., VA. Dept. of Physics.

Physics

Cmos, Cosmic Rays, Linear Energy Transfer (Let), Metal Oxide Semiconductors, Photovoltaic Effect, Random Access Memory, Single Event Upsets, Chips (Electronics), Computer Aided Design, Irradiation, Numerical Control, Radiation Dosage

Scientific paper

Assistance was provided to the Brookhaven Single Event Upset (SEU) Test Facility. Computer codes were developed for fragmentation and secondary radiation affecting Very Large Scale Integration (VLSI) in space. A computer controlled CV (HP4192) test was developed for Terman analysis. Also developed were high speed parametric tests which are independent of operator judgment and a charge pumping technique for measurement of Dit (E). The X-ray secondary effects, and parametric degradation as a function of dose rate were simulated. The SPICE simulation of static RAMs with various resistor filters was tested.

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