Effect of screening on shot noise in diffusive mesoscopic conductors

Details Effect of screening on shot noise in diffusive mesoscopic conductors Effect of screening on shot noise in diffusive mesoscopic conductors

1997-01-14

arxiv.org/abs/cond-mat/9701095v4

Phys. Rev. Lett. 79, 3482 (1997)

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

5 pages, 3 figures. Published version. Also available in the journal's format at http://hana.physics.sunysb.edu/~yehuda/cv/p

Scientific paper

10.1103/PhysRevLett.79.3482

Shot noise in diffusive mesoscopic conductors, at finite observation frequencies $\omega $ (comparable to the reciprocal Thouless time $\tau_T^{-1}$), is analyzed with an account of screening. At low frequencies, the well-known result $S_I(\omega)=2eI/3$ is recovered. This result is valid at arbitrary $\omega \tau_T$ for wide conductors longer than the screening length. However, at least for two very different systems, namely, wide and short conductors, and thin conductors over a close ground plane, noise approaches a different fundamental level, $S_I(\omega) = eI$, at $\omega \tau _T\gg 1$.

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