Effect of LaAlO$_3$ Surface Topography on RF Current Distribution in Superconducting Microwave Devices

Details Effect of LaAlO$_3$ Surface Topography on RF Current Distribution in Superconducting Microwave Devices Effect of LaAlO$_3$ Surface Topography on RF Current Distribution in Superconducting Microwave Devices

2002-09-26

arxiv.org/abs/cond-mat/0209614v1

Appl. Phys. Lett. 81, 4979 (2002)

Physics

Condensed Matter

Superconductivity

13 pages, 4 figures, submitted to Applied Physics Letters

Scientific paper

10.1063/1.1530753

A laser scanning microscope with a thermal spot size of about 4 $\mu$m is used to measure a quantity proportional to the rf current density in an operating superconducting co-planar waveguide microwave resonator. The twinning of the LaAlO$_3$ substrate produces a meandering of the current at the edges due to irregularities in the wet etching of the YBa$_2$Cu$_3$O$_{7-\delta}$ film associated with substrate twin domain blocks, and a ($\sim$ 20%) enhancement of the rf photoresponse at these locations. These irregularities are candidates for enhanced nonlinear response from the device. The effects of substrate twinning and the resulting edge features on the superconducting film are discussed and analyzed.

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