Drift of charged defects in local fields as aging mechanism in ferroelectrics

Details Drift of charged defects in local fields as aging mechanism in ferroelectrics Drift of charged defects in local fields as aging mechanism in ferroelectrics

2007-04-19

arxiv.org/abs/0704.2610v1

Physical Review B 75, 184107 (2007)

Physics

Condensed Matter

Materials Science

24 pages, 12 figures, accepted to Physical Review B

Scientific paper

10.1103/PhysRevB.75.184107

Point defect migration is considered as a mechanism for aging in ferroelectrics. Numerical results are given for the coupled problems of point defect migration and electrostatic energy relaxation in a 2D domain configuration. The peak values of the clamping pressure at domain walls are in the range of $10^6$ Pa, which corresponds to macroscopically observed coercive stresses in perovskite ferroelectrics. The effect is compared to mechanisms involving orientational reordering of defect dipoles in the bulk of domains. Domain clamping is significantly stronger in the drift mechanism than in the orientational picture for the same material parameters.

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