Double-tip STM for Surface Analysis

Details Double-tip STM for Surface Analysis Double-tip STM for Surface Analysis

1994-05-13

arxiv.org/abs/cond-mat/9405036v2

Physics

Condensed Matter

Minor changes, to appear in Phys.Rev.B, 12 pages + 2 figures

Scientific paper

We explore the possibility of using a double-tip STM to probe the single electron Green function of a sample surface, and describe a few important applications: (1) Probing constant energy surfaces in $\k$-space by ballistic transport; (2) Measuring scattering phase shifts of defects; (3) Observing the transition from ballistic to diffusive transport to localization; and (4) Measuring inelastic mean free paths.

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