Physics
Scientific paper
Mar 2005
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2005aps..mars35007b&link_type=abstract
American Physical Society, APS March Meeting, March 21-25, 2005, abstract #S35.007
Physics
Scientific paper
Very little is known about the structure of organic molecular thin films at their rest potential. Further, it is not known whether the structure of these films is modified by an applied potential. We present a new x-ray scattering technique, which allows high-resolution structural studies of buried self-assembled monolayers (SAMs) that are sandwiched between silicon and mercury junctions. The high-energy x-ray beams, utilized in the present studies (32 keV), penetrate through the conducting silicon electrode. The x-ray reflectivity interference pattern thus provides information on the thickness and orientation of the molecules in the electronic junction. Our results, for alkane-thiol and alkane-silane layers, show that the SAMs form homogenous densely packed monolayers within the deeply buried interface. The thickness of these layers is compared with the SAMs prepared at the vapor/vacuum interfaces on mercury and silicon.
Baumert Julian
Deutsch Moshe
Lefenfeld Michael
Nuckolls Colin
Ocko Ben
No associations
LandOfFree
Direct Observation of a Molecular Junction using High-Energy X-ray Reflectometry does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.
If you have personal experience with Direct Observation of a Molecular Junction using High-Energy X-ray Reflectometry, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Direct Observation of a Molecular Junction using High-Energy X-ray Reflectometry will most certainly appreciate the feedback.
Profile ID: LFWR-SCP-O-1214331