Direct measurement of spatial modes of a micro-cantilever from thermal noise

Details Direct measurement of spatial modes of a micro-cantilever from thermal noise Direct measurement of spatial modes of a micro-cantilever from thermal noise

2009-04-29

arxiv.org/abs/0904.4539v4

Journal of Applied Physics 106 (2009) 094313

Physics

Condensed Matter

Statistical Mechanics

Scientific paper

10.1063/1.3245394

Measurements of the deflection induced by thermal noise have been performed on a rectangular atomic force microscope cantilever in air. The detection method, based on polarization interferometry, can achieve a resolution of 1E-14 m/rtHz in the frequency range 1 kHz ? 800 kHz. The focused beam from the interferometer probes the cantilever at different positions along its length and the spatial modes' shapes are determined up to the fourth resonance, without external excitation. Results are in good agreement with theoretically expected behavior. From this analysis accurate determination of the elastic constant of the cantilever is also achieved.

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