Direct measurement of inter-filament resistance in Nb3Sn multi-filamentary strands

Physics – Condensed Matter – Superconductivity

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

14 pages, 5 figures

Scientific paper

In modeling the properties of superconducting multi-filamentary strands, the filament twist pitch and the inter-filament transverse resistivity play a crucial role in the definition of the current transfer length. This affects the AC losses of NbTi strands, or the transport properties of Nb3Sn wires subject to a bending strain. Although the effect of filament twist pitch on the critical current of the strand has been studied, the value of the inter-filament resistance in Nb3Sn strands is still undefined. We have performed a direct measurement of the inter-filament transverse resistance within the cross-section of a Nb3Sn multi-filamentary strand from room temperature to 4.2K. Results have been compared to the inter-filament resistance of a sample on which the outer copper stabilization layer was removed by chemical etching, obtaining interesting indications on the preferential current paths within the wire cross section.

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

Direct measurement of inter-filament resistance in Nb3Sn multi-filamentary strands does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Direct measurement of inter-filament resistance in Nb3Sn multi-filamentary strands, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Direct measurement of inter-filament resistance in Nb3Sn multi-filamentary strands will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-395597

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.