Direct determination of the electron-electron mean free path in diffusive mesoscopic samples using shot noise

Details Direct determination of the electron-electron mean free path in diffusive mesoscopic samples using shot noise Direct determination of the electron-electron mean free path in diffusive mesoscopic samples using shot noise

1998-06-29

arxiv.org/abs/cond-mat/9806340v2

Phys. Rev. B, 58, R13387 (1998)

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

4 pages, published version

Scientific paper

10.1103/PhysRevB.58.R13387

Using the 'drift-diffusion-Langevin' equation, we have recently shown that finite-frequency shot noise in diffusive mesoscopic conductors is very sensitive to the ratio $\gamma \equiv L/\lee$ between the sample length $L$ and the electron-electron mean free path $\lee$. In this work we present numerical calculations of the noise at arbitrary value of $\gamma$. If coupled with accurate noise measurements, the results presented here could serve as a new and independent way of determining $\lee$ in a given sample.

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