Direct and inverse measurement of thin films magnetostriction

Details Direct and inverse measurement of thin films magnetostriction Direct and inverse measurement of thin films magnetostriction

2009-11-10

arxiv.org/abs/0911.1914v1

Physics

Condensed Matter

Materials Science

13 pages, 10 figures, 1 table, submitted to JMMM

Scientific paper

Two techniques of measurements of thin film magnetostriction are compared: direct, when changes of the substrate curvature caused by the film magnetization are controlled, and inverse ("indirect"), when the modification of the magnetic anisotropy induced by the substrate deformation (usually bending) is measured. We demonstrate how both the elastic strength of the substrate and the effective magneto-mechanical coupling between the substrate deformation and magnetic anisotropy of the film depend on different conditions of bending. Equations to be used for magnetostriction value determination in typical cases are given and critical parameters for the corresponding approximations are identified.

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