Diffusion and submonolayer island growth during hyperthermal deposition on Cu(100) and Cu(111)

Physics – Condensed Matter – Materials Science

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

18 pages, 3 figures

Scientific paper

We consider the influence of realistic island diffusion rates to homoepitaxial growth on metallic surfaces using a recently developed rate equation model which describes growth in the submonolayer regime with hyperthermal deposition. To this end, we incorporate realistic size and temperature-dependent island diffusion coefficients for the case of homoepitaxial growth on Cu(100) and Cu(111) surfaces. We demonstrate that the generic features of growth remain unaffected by the details of island diffusion, thus validating the generic scenario of high density of small islands found experimentally and theoretically for large detachment rates. However, the details of the morphological transition and scaling of the mean island size are strongly influenced by the size dependence of island diffusion. This is reflected in the scaling exponent of the mean island size, which depends on both temperature and the surface geometry.

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

Diffusion and submonolayer island growth during hyperthermal deposition on Cu(100) and Cu(111) does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Diffusion and submonolayer island growth during hyperthermal deposition on Cu(100) and Cu(111), we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Diffusion and submonolayer island growth during hyperthermal deposition on Cu(100) and Cu(111) will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-287127

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.