Dielectric and Dilatometric Studies of Glass Transitions in Thin Polymer Films

Details Dielectric and Dilatometric Studies of Glass Transitions in Thin Polymer Films Dielectric and Dilatometric Studies of Glass Transitions in Thin Polymer Films

2000-12-26

arxiv.org/abs/cond-mat/0012464v1

J.Phys.IV France Vol.10 (2000) Pr7-243-246

Physics

Condensed Matter

Soft Condensed Matter

4 pages, 5 figures

Scientific paper

Dielectric relaxation and thermal expansion spectroscopy were made for thin polystyrene films in order to measure the temperature $T_{\alpha}$ corresponding to the peak in the loss component of susceptibility due to the $\alpha$-process and the $\alpha$-relaxation time $\tau$ as functions of film thickness $d$. While the glass transition temperature $T_{\rm g}$ decreases with decreasing film thickness, $T_{\alpha}$ and $\tau$ were found to remain almost constant for $d>d_{\rm c}$ and decrease drastically for $d

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