Determining exciton bandwidth and film microstructure in polythiophene films using linear absorption spectroscopy

Details Determining exciton bandwidth and film microstructure in polythiophene films using linear absorption spectroscopy Determining exciton bandwidth and film microstructure in polythiophene films using linear absorption spectroscopy

2009-03-10

arxiv.org/abs/0903.1670v1

Appl. Phys. Lett. 2009 vol. 94 (16) pp. 163306

Physics

Condensed Matter

Materials Science

Applied Physics Letters (in press); 9 pages, three figures

Scientific paper

10.1063/1.3110904

We analyze the linear absorption spectrum of regioregular poly(3-hexylthiophene) films spun from a variety of solvents to probe directly the film microstructure and how it depends on processing conditions. We estimate the exciton bandwidth and the percentage of the film composed of aggregates quantitatively using a weakly interacting H-aggregate model. This provides a description of the degree and quality of crystallites within the film and is in turn correlated with thin-film field-effect transistor characteristics.

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