Physics – Condensed Matter – Materials Science
Scientific paper
2010-08-12
Appl. Phys. Express 3 (2010) 095101 (3 pages)
Physics
Condensed Matter
Materials Science
15 pages, 4 figures
Scientific paper
10.1143/APEX.3.095101
Using a scanning electron microscope, we observed a reproducible, discrete distribution of secondary electron intensity stemming from an atomically thick graphene film on a thick insulating substrate. The discrete distribution made it possible to uniquely relate the secondary electron intensity to the number of graphene layers. Furthermore, we found a distinct linear relationship between the relative secondary electron intensity from graphene and the number of layers, provided a low primary electron acceleration voltage was used. Based on these observations, we propose a practical method to determine the number of graphene layers in a sample. This method is superior to the conventional optical method in its capability to characterize graphene samples with sub-micrometer squares in area on various insulating substrates.
Hiura Hidefumi
Miyazaki Hisao
Tsukagoshi Kazuhito
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