Physics – Condensed Matter – Materials Science
Scientific paper
1997-07-16
Phys. Rev. E 58, 2779 (1998)
Physics
Condensed Matter
Materials Science
10 pages RevTeX, 13 Postscript figures. Some additional material compared to previous version
Scientific paper
10.1103/PhysRevE.58.2779
We propose a new method for (global) Hurst exponent determination based on wavelets. Using this method, we analyze synthetic data with predefined Hurst exponents, fracture surfaces and data from economy. The results are compared with those obtained from Fourier spectral analysis. When many samples are available, the wavelet and Fourier methods are comparable in accuracy. However, when one or only a few samples are available, the wavelet method outperforms the Fourier method by a large margin.
Hansen Angela
Nes Olav Magnar
Simonsen Ingve
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