Determination of substrate pinning in epitaxial and supported graphene layers via Raman scattering

Details Determination of substrate pinning in epitaxial and supported graphene layers via Raman scattering Determination of substrate pinning in epitaxial and supported graphene layers via Raman scattering

2011-01-24

arxiv.org/abs/1101.4673v1

Phys. Rev. B 83, 081410(R) (2011)

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

4 pages, 5 figures. To appear in Physical Review B, Brief Communication

Scientific paper

10.1103/PhysRevB.83.081410

The temperature-induced shift of the Raman G line in epitaxial graphene on SiC and Ni surfaces, as well as in graphene supported on SiO2, is investigated with Raman spectroscopy. The thermal shift rate of epitaxial graphene on 6H-SiC(0001) is found to be about three times that of freestanding graphene. This result is explained quantitatively as a consequence of pinning by the substrate. In contrast, graphene grown on polycrystalline Ni films is shown to be unpinned, i.e., to behave elastically as freestanding, despite the relatively strong interaction with the metal substrate. Moreover, it is shown that the transfer of exfoliated graphene layers onto a supporting substrate can result in pinned or unpinned layers, depending on the transfer protocol.

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