Depth Resolution of Piezoresponse Force Microscopy

Details Depth Resolution of Piezoresponse Force Microscopy Depth Resolution of Piezoresponse Force Microscopy

2009-05-13

arxiv.org/abs/0905.2209v1

Appl. Phys. Lett. 94, 172904 (2009)

Physics

Condensed Matter

Materials Science

8 pages, 5 figure

Scientific paper

Given that a ferroelectric domain is generally a three dimensional entity, the determination of its area as well as its depth is mandatory for full characterization. Piezoresponse force microscopy (PFM) is known for its ability to map the lateral dimensions of ferroelectric domains with high accuracy. However, no depth profile information has been readily available so far. Here, we have used ferroelectric domains of known depth profile to determine the dependence of the PFM response on the depth of the domain, and thus effectively the depth resolution of PFM detection.

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