Depth-dependent critical behavior in V2H

Details Depth-dependent critical behavior in V2H Depth-dependent critical behavior in V2H

2009-02-13

arxiv.org/abs/0902.2414v3

Phys. Rev. B 79, 184113 (2009)

Physics

Condensed Matter

Materials Science

5 pages, 4 figures

Scientific paper

Using X-ray diffuse scattering, we investigate the critical behavior of an order-disorder phase transition in a defective "skin-layer" of V2H. In the skin-layer, there exist walls of dislocation lines oriented normal to the surface. The density of dislocation lines within a wall decreases continuously with depth. We find that, because of this inhomogeneous distribution of defects, the transition effectively occurs at a depth-dependent local critical temperature. A depth-dependent scaling law is proposed to describe the corresponding critical ordering behavior.

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