Dependence of resistivity on surface profile in nanoscale metal films and wires

Details Dependence of resistivity on surface profile in nanoscale metal films and wires Dependence of resistivity on surface profile in nanoscale metal films and wires

2007-12-17

arxiv.org/abs/0712.2633v1

J. Appl. Phys. 103, 113715 (2008)

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

Scientific paper

10.1063/1.2937085

We extend quantum models of nanowire surface scattering to incorporate bulk resistivity and extract an expression for the increased resistivity due to surface roughness. To learn how to improve conductivity, we calculate conductivity degradation from individual wavelengths of surface roughness, and show how these can be convolved to give resistivity for arbitrary surfaces. We review measurements from Cu films and conclude that roughness at short wavelengths (less than 100 nm) dominates scattering, and that primarily specular scattering should be achievable for RMS roughness below about 0.7 nm.

Affiliated with

Also associated with

No associations

Rating

Dependence of resistivity on surface profile in nanoscale metal films and wires does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Dependence of resistivity on surface profile in nanoscale metal films and wires, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dependence of resistivity on surface profile in nanoscale metal films and wires will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-115788