Density functional theory based study of graphene and dielectric oxide interfaces

Details Density functional theory based study of graphene and dielectric oxide interfaces Density functional theory based study of graphene and dielectric oxide interfaces

2011-02-13

arxiv.org/abs/1102.2557v1

J. Phys.: Condens. Matter 23 505503 2011

Physics

Condensed Matter

Materials Science

Scientific paper

10.1088/0953-8984/23/50/505503

We study the effects of insulating oxides in their crystalline forms on the energy band structure of monolayer and bilayer graphene using a \textit{first principles} density functional theory based electronic structure method and a local density approximation. We consider the dielectric oxides, SiO$_{2}$ ($\alpha$-quartz) and Al$_{2}$O$_{3}$ (alumina or $\alpha$-sapphire) each with two surface terminations. Our study suggests that atomic relaxations and resulting equilibrium separations play a critical role in perturbing the linear band structure of graphene in contrast to the less critical role played by dangling bonds that result from cleaving the crystal in a particular direction. We also see that with the addition of a second graphene layer, the Dirac cone is restored for the quartz surface terminations. Alumina needs more than two graphene layers to preserve the Dirac cone. Our results are at best semi-quantitative for the common amorphous forms of the oxides considered. However, crystalline oxides for which our results are quantitative provide an interesting option for graphene based electronics, particularly in light of recent experiments on graphene with crystalline dielectrics (hexagonal BN) that find considerable improvements in transport properties as compared to the those with amorphous dielectrics.

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