Current suppression in a double-island single-electron transistor for detection of degenerate charge configurations of a floating double-dot

Physics – Condensed Matter

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

3 pages, 3 figures, to appear in Appl. Phys. Lett

Scientific paper

10.1063/1.1630382

We have investigated a double-island single-electron transistor (DISET) coupled to a floating metal double-dot (DD). Low-temperature transport measurements were used to map out the charge configurations of both the DISET and the DD. A suppression of the current through the DISET was observed whenever the charge configurations of the DISET and the DD were energetically co-degenerate. This effect was used to distinguish between degenerate and non-degenerate charge configurations of the double-dot. We also show that this detection scheme reduces the susceptibility of the DISET to interference from random charge noise.

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

Current suppression in a double-island single-electron transistor for detection of degenerate charge configurations of a floating double-dot does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Current suppression in a double-island single-electron transistor for detection of degenerate charge configurations of a floating double-dot, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Current suppression in a double-island single-electron transistor for detection of degenerate charge configurations of a floating double-dot will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-509635

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.