Current Noise Investigation in Josephson Devices by Switching Current Measurements

Details Current Noise Investigation in Josephson Devices by Switching Current Measurements Current Noise Investigation in Josephson Devices by Switching Current Measurements

2010-07-09

arxiv.org/abs/1007.1540v1

Physics

Condensed Matter

Superconductivity

6 pages, 5 figures

Scientific paper

An experimental investigation of the critical current noise in underdamped niobium based Josephson junctions by a technique based on the switching current measurements is reported. By sweeping the junction with a current ramp we measure the critical current switching using the standard time of flight technique and analyze the data to extract the current noise. The experimental results show a linear behavior of the current white noise from both the junction area and the temperature. These measurement provide very useful information about the intrinsic noise of Josephson devices involving SQUIDs and qubits.

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