Physics – Condensed Matter – Mesoscale and Nanoscale Physics
Scientific paper
2010-10-07
RSI 82, 033705 (2011)
Physics
Condensed Matter
Mesoscale and Nanoscale Physics
10 pages, 5 Figures, Accepted to Review of Scientific Instrument
Scientific paper
10.1063/1.3554438
We report the instrumentation and experimental results of a cryogenic scanning microwave impedance microscope. The microwave probe and the scanning stage are located inside the variable temperature insert of a helium cryostat. Microwave signals in the distance modulation mode are used for monitoring the tip-sample distance and adjusting the phase of the two output channels. The ability to spatially resolve the metal-insulator transition in a doped silicon sample is demonstrated. The data agree with a semi-quantitative finite-element simulation. Effects of the thermal energy and electric fields on local charge carriers can be seen in the images taken at different temperatures and DC biases.
Kelly Michael A.
Kundhikanjana Worasom
Lai Keji
Shen Zhi-Xun
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