Crossover from classical to random-field critical exponents in As-doped TbVO4

Details Crossover from classical to random-field critical exponents in As-doped TbVO4 Crossover from classical to random-field critical exponents in As-doped TbVO4

2000-02-10

arxiv.org/abs/cond-mat/0002158v1

Physics

Condensed Matter

Disordered Systems and Neural Networks

7 pages including 4 figures; To be published in Physical Review B

Scientific paper

10.1103/PhysRevB.61.11197

Using birefringence techniques we have measured the critical exponents beta, gamma, and delta in As-doped TbVO4, a structural realization of the random-field Ising model where random strain fields are introduced by V-As size mismatch. For pure TbVO4 we observe the expected classical critical exponents, while for a mixed sample with 15% As concentration our results are beta=0.31 +/-0.03, gamma=1.22 +/-0.07, and delta=4.2 +/-0.7. These values are consistent with the critical exponents for the short range pure Ising model in three dimensions in agreement with a prediction by Toh. The susceptibility data showed a crossover with temperature from classical to random field critical behaviour.

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