Critical Thickness in Dewetting Films

Details Critical Thickness in Dewetting Films Critical Thickness in Dewetting Films

2001-10-06

arxiv.org/abs/cond-mat/0110123v1

Physics

Condensed Matter

Soft Condensed Matter

10 pages, 2 plots, 3 images in jpg

Scientific paper

We study dewetting of thin polymer films with built-in topographical fluctuations produced by rubbing the film surface with a rayon cloth. By varying the density of imposed surface defects, we unambiguously distinguish spinodal dewetting, which dominates in liquid films thinner than a characteristic thickness = 13.3 nm, from heterogeneous nucleation in the thicker films. Invariance of this characteristic thickness upon more than a decade change in the defect density makes kinetic effect an unseemly origin. A crossover of the spinodal line provides a consistent picture. This interpretation, however, contends the current understanding of molecular interactions in apolar liquid films.

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