Critical current diffraction pattern of SIFS Josephson junctions with step-like F-layer

Details Critical current diffraction pattern of SIFS Josephson junctions with step-like F-layer Critical current diffraction pattern of SIFS Josephson junctions with step-like F-layer

2010-06-26

arxiv.org/abs/1006.5109v2

Supercond. Sci. Technol. 23, 095007 (2010)

Physics

Condensed Matter

Superconductivity

7 pages, 3 figures

Scientific paper

10.1088/0953-2048/23/9/095007

We present the latest generation of superconductor-insulator-ferromagnet-superconductor Josephson tunnel junctions with a step-like thickness of the ferromagnetic (F) layer. The F-layer thicknesses $d_1$ and $d_2$ in both halves were varied to obtain different combinations of positive and negative critical current densities $j_{c,1}$ and $j_{c,2}$. The measured dependences of the critical current on applied magnetic field can be well described by a model which takes into account different critical current densities (obtained from reference junctions) and different net magnetization of the multidomain ferromagnetic layer in both halves.

Affiliated with

Also associated with

No associations

Rating

Critical current diffraction pattern of SIFS Josephson junctions with step-like F-layer does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Critical current diffraction pattern of SIFS Josephson junctions with step-like F-layer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Critical current diffraction pattern of SIFS Josephson junctions with step-like F-layer will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-525603