Correlation between x-ray reflectivity measurements and surface roughness of AXAF coated witness samples

Details Correlation between x-ray reflectivity measurements and surface roughness of AXAF coated witness samples Correlation between x-ray reflectivity measurements and surface roughness of AXAF coated witness samples

Jul 1996

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1996spie.2805..268c&link_type=abstract

Proc. SPIE Vol. 2805, p. 268-276, Multilayer and Grazing Incidence X-Ray/EUV Optics III, Richard B. Hoover; Arthur B. Walker; Ed

Physics

Optics

Scientific paper

One of the specifications used to polish the AXAF witness samples was that the rms surface roughness be

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