Physics
Optics
Scientist
Harvard-Smithsonian Ctr. for Astrophysics
Application of multilayer coatings to replicated substrates
AXAF synchrotron witness mirror calibrations 2 to 12 keV
Correlation between x-ray reflectivity measurements and surface roughness of AXAF coated witness samples
Monitoring program for the coating of the AXAF flight optics
Reflectance calibrations of AXAF witness mirrors using synchrotron radiation: 2 to 12 keV
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