Control of Material Damping in High-Q Membrane Microresonators

Details Control of Material Damping in High-Q Membrane Microresonators Control of Material Damping in High-Q Membrane Microresonators

2011-11-07

arxiv.org/abs/1111.1703v2

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

Scientific paper

We study the mechanical quality factors of bilayer aluminum/silicon-nitride membranes. By coating ultrahigh-Q Si3N4 membranes with a more lossy metal, we can precisely measure the effect of material loss on Q's of tensioned resonator modes over a large range of frequencies. We develop a theoretical model that interprets our results and predicts the damping can be reduced significantly by patterning the metal film. Using such patterning, we fabricate Al-Si3N4 membranes with ultrahigh Q at room temperature. Our work elucidates the role of material loss in the Q of membrane resonators and informs the design of hybrid mechanical oscillators for optical-electrical-mechanical quantum interfaces.

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