Physics – Condensed Matter – Materials Science
Scientific paper
2011-02-10
Physics
Condensed Matter
Materials Science
5 Fig
Scientific paper
A new experimental approach for the characterization of the lateral elastic modulus of individual nanowires is demonstrated by implementing a micro/nano scale diametrical compression test geometry, using a flat punch indenter inside of a scanning electron microscope (SEM). A 250 nm diameter single crystal silicon nanowire is tested. Since silicon is highly anisotropic, the compression axis of the wire was determined by electron backscatter diffraction (EBSD). A two dimensional analytical closed-form solution based on a Hertz model is presented. The results of the analytical model are compared with those of finite-element simulations and to the experimental diametral compression results and show good agreement.
Ghisleni R.
Michler Johann
Mook W. M.
Niederberger Ch.
Philippe Leroux
No associations
LandOfFree
Compression of nanowires using a flat indenter: Elasticity measurement in nanoscale does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.
If you have personal experience with Compression of nanowires using a flat indenter: Elasticity measurement in nanoscale, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Compression of nanowires using a flat indenter: Elasticity measurement in nanoscale will most certainly appreciate the feedback.
Profile ID: LFWR-SCP-O-694492