Comparison of Resonant Inelastic X-Ray Scattering Spectra and Dielectric Loss Functions in Copper Oxides

Details Comparison of Resonant Inelastic X-Ray Scattering Spectra and Dielectric Loss Functions in Copper Oxides Comparison of Resonant Inelastic X-Ray Scattering Spectra and Dielectric Loss Functions in Copper Oxides

2008-11-09

arxiv.org/abs/0811.1379v1

Phys. Rev. B 79, 094525 (2009)

Physics

Condensed Matter

Strongly Correlated Electrons

5 pages, 3 figures

Scientific paper

10.1103/PhysRevB.79.094525

We report empirical comparisons of Cu K-edge indirect resonant inelastic x-ray scattering (RIXS) spectra, taken at the Brillouin zone center, with optical dielectric loss functions measured in a number of copper oxides. The RIXS data are obtained for Bi$_2$CuO$_4$, CuGeO$_3$, Sr$_2$Cu$_3$O$_4$Cl$_2$, La$_2$CuO$_4$, and Sr$_2$CuO$_2$Cl$_2$, and analyzed by considering both incident and scattered photon resonances. An incident-energy-independent response function is then extracted. The dielectric loss functions, measured with spectroscopic ellipsometry, agree well with this RIXS response, especially in Bi$_2$CuO$_4$ and CuGeO$_3$.

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