Physics – Condensed Matter – Superconductivity
Scientific paper
1999-06-03
Physics
Condensed Matter
Superconductivity
Submitted to IEEE Trans. MTT
Scientific paper
The effect of the patterning process on the nonlinearity of the microwave surface resistance $R_S$ of YBCO thin films is investigated. With the use of a sapphire dielectric resonator and a stripline resonator, the microwave $R_S$ of YBCO thin films was measured before and after the patterning process, as a function of temperature and the rf peak magnetic field in the film. The microwave loss was also modeled, assuming a $J_{rf}^2$ dependence of $Z_S(J_{rf})$ on current density $J_{rf}$. Experimental and modeled results show that the patterning has no observable effect on the microwave residual $R_S$ or on the power dependence of $R_S$.
Anderson Anja C.
Dresselhaus Gene
Dresselhaus Mildred S.
Oates D. E.
Slattery R. L.
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