Comment on "Short-term Anneal of 30-MeV Electron Damage in High-Purity n-Type Silicon"

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Feb 1972

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1972itns...19..897s&link_type=toc

IEEE Transactions on Nuclear Science, vol. NS-19, Number 1. 18th Nuclear Science Symposium and 3rd Nuclear Power Systems Symposi

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