Combined scanning force microscopy and scanning tunneling spectroscopy of an electronic nano-circuit at very low temperature

Details Combined scanning force microscopy and scanning tunneling spectroscopy of an electronic nano-circuit at very low temperature Combined scanning force microscopy and scanning tunneling spectroscopy of an electronic nano-circuit at very low temperature

2006-10-16

arxiv.org/abs/cond-mat/0610408v2

Applied Physics Letters 90 (22/01/2007) 043114

Physics

Condensed Matter

Superconductivity

4 pages

Scientific paper

10.1063/1.2436651

We demonstrate the combination of scanning force microscopy and scanning tunneling spectroscopy in a local probe microscope operating at very low temperature (60 mK). This local probe uses a quartz tuning fork ensuring high tunnel junction stability. We performed the spatially-resolved spectroscopic study of a superconducting nano-circuit patterned on an insulating substrate. Significant deviations from the BCS prediction are observed.

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