Charge Sensing in Intrinsic Silicon Quantum Dots

Details Charge Sensing in Intrinsic Silicon Quantum Dots Charge Sensing in Intrinsic Silicon Quantum Dots

2010-02-11

arxiv.org/abs/1002.2381v1

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

To be published in Appl. Phys. Lett

Scientific paper

We report charge sensing measurements on a silicon quantum dot (QD) with a nearby silicon single electron transistor (SET) acting as an electrometer. The devices are electrostatically formed in bulk silicon using surface gates. We show that as an additional electron is added onto the quantum dot, a charge is induced on the SET of approximately 0.2e. These measurements are performed in the many electron regime, where we can count in excess of 20 charge additions onto the quantum dot.

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